A·P·E offers a choice of solutions for ultrafast pulse measurements. Each is tailored to your type of laser system, with a wealth of innovations for greater accuracy and user simplicity.
From material processing to scientific and medical base research, ultrafast laser systems are used in many areas of their high peak intensity and extremely short pulse width. One relevant area of application is time resolved spectroscopy. The pulse width is a critical factor for the adjustment of these laser systems and the characterization of experiments. APE autocorrelators measure this parameter from 10 fs ... 400 ps for almost any wavelength range.
Pulse Measurement Perfection with the Multitalent from APE
It is good to have plenty of options at hand. Suitable for the characterization of virtually any ultrafast pulsed laser, the pulseCheck autocorrelator from APE covers the broadest possible range of wavelengths and pulse widths. This flexibility is achieved by using exchangeable Optics Sets, typically consisting of a nonlinear crystal and a dedicated detector module.
Maximum Functionality through Modular Design
APE fulfills a growing need for maximum functionality and flexibility with the modular concept on which its pulseCheck autocorrelator series is based.
From Ultrashort to Longer Pulses
The various pulseCheck configurations can be optimized accordingly to suit your individual pulse width measurement needs. Extra-long pulse durations are accessible with pulseCheck SM, which utilizes fast and highly precise stepping motor technology to measure long pulses across a larger scan range.
High Sensitivity and Low Noise with Three Types of Detectors
The three detector types address the need for low noise and enhanced sensitivity in different applications. For pulse measurement with extreme sensitivity and low pulse energy, we recommend our photomultiplier (PMT) detector. Spectrally enhanced photodiodes (PD, TPA), on the other hand, are the ideal choice for measurements requiring sensitivities of a few mW2.
Ultimate Wavelength Range
The detectors and Optics Sets available from APE cover a wide range of wavelengths, from UV at 200 nm to Mid-IR at 12 µm.
Complete Pulse Characterization with pulseCheck and FROG Option
Second Harmonic Generation FROG is the most popular spectrometer-less Frequency Resolved Optical Gating method. The pulseCheck autocorrelators by APE optionally integrate FROG, giving access to complete pulse characterization. The addition of a special nonlinear crystal module and dedicated software opens the door to complete spectral and temporal pulse characterization.
Watch our pulseLink video!
- Exchangeable Optics Sets for broadest spectrum coverage from 200 nm to 12 µm
- Pulse widths from as low as < 10 fs all the way up to 400 ps
- Ultra-precise delay resolution
- Toggle between interferometric and intensity autocorrelation
- Wide range of sensitivity levels covered with PMT, PD, and TPA
- Automatic phase matching
- Gaussian, Sech2, and Lorentzian fitting routines
- Ready to use software and USB interface
- TCP/IP remote control with standardized command set for easy programming
- NIST traceable calibration
|Measurable Pulse Width Range||
depending on Base Unit:
< 10 fs ... 3.5 ps < 10 fs ... 12 ps < 50 fs ...35 ps < 120 fs ... 60 ps
|200 nm - 12 µm, depends on Optics Set|
|Detector (Optics Sets)||PMT, PD, or TPA|
|Delay Resolution||< 0.001 % of scan range|
|Delay Linearity||< 1 %|
|Sensitivity||Typically 1 ... 10-6 W2 depending on Optics Set*|
|Recommended Repetition Rate||PD, TPA: 10 Hz and above; PMT: 250 kHz and above|
|Type of Measurement Mode||PMT, PD : non-collinear intensity, collinear interferometric;
TPA: hybrid collinear intensity
|Mode Switching||Available for PMT, PD|
|SHG Tuning for Phase Matching||PMT/PD: automatic; TPA: not applicable|
|Trigger Mode||TTL, f < 50 kHz; pulseCheck SM < 1 kHz|
|Input Polarization||Linear horizontal, vertical available as option|
|Input Beam Coupling||Free-space; Option: fiber coupling FC/PC, FC/APC, SMA|
|Max Input Power||1 W (e.g. oscillator with a rep. rate of approx. 70 MHz) or 10 μJ (e.g. ampliﬁed system with rep. rates in the kHz range), whichever results in lower value|
|Input Aperture||6 mm (free-space)|
|Software||Included; Real-time display of pulse width and central wavelength, different fitting routines|
|Fitting Routine||Gaussian, Sech2, Lorentz|
|Remote Control||Possible via TCP/IP (SCPI command set)|
|Calibration||NIST traceable calibration certificate included|
* Measured sensitivity including Optics Set, defined as average power times peak power of the incident pulses PAV * Ppeak
This device is available directly via A·P·E and in the countries listed below via our exclusive distribution partners:
Australia: Coherent Scientific
Great Britain and Ireland: Photonic Solutions
India: Laser Science
Israel: Ammo Engineering
Scandinavia, Baltic States: Gammadata
Spain, Portugal: Innova Scientific
USA, Canada, Middle and South America: A.P.E America
A selection of publications mentioning the use of the pulseCheck:
Chapman et al., Femtosecond pulses at 20 GHz repetition rate through spectral masking of a phase modulated signal and nonlinear pulse compression,
Optics Express, Vol. 21, Issue 5, pp. 5671-5676 (2013), Link (DOI) | Link
Mou et al., Passively harmonic mode locked erbium doped fiber soliton laser with carbon nanotubes based saturable absorber,
Optical Materials Express, Vol. 2, Issue 6, pp. 884-890 (2012), Link (DOI) | Link
Nillon et al., Versatile dual stage tunable NOPA with pulse duration down to 17 fs and energy up to 3 μJ at 500 kHz repetition rate,
The European Conference on Lasers and Electro-Optics (2013), Link (DOI) | Link
Liu et al., High-power wavelength-tunable photonic-crystal-fiberbased oscillator-amplifier-frequency-shifter femtosecond laser system and its applications for material microprocessing,
Laser Physics Letters, Vol. 6, Issue 1, pp. 44-48 (2009), Link (DOI) | Link
Nomura et al., Observation and analysis of structural changes in fused silica by continuous irradiation with femtosecond laser light having an energy density below the laser-induced damage threshold,
Beilstein Journal of Nanotechnology, Vol. 5, pp. 1334-40 (2014), Link (DOI) | Link