A·P·E offers a choice of solutions for ultrafast pulse measurements. Each is tailored to your type of laser system, with a wealth of innovations for greater accuracy and user simplicity.
From material processing to scientific and medical base research, ultrafast laser systems are used in many areas of their high peak intensity and extremely short pulse width. One relevant area of application is time resolved spectroscopy. The pulse width is a critical factor for the adjustment of these laser systems and the characterization of experiments. A∙P∙E autocorrelators measure this parameter from 10 fs ... 500 ps for almost any wavelength range.
The autocorrelator pulseCheck USB is a versatile instrument for measuring the pulse width of different fs and ps laser systems with the ability to cover a broad wavelength range using different Optics Sets1), which can be upgraded in the field.
The pulseCheck USB with pulseLink controller combines the standard pulseCheck optical head with the new pulseLink controller replacing the standard control unit of the pulseCheck. It controls the measuring process, while being connected via USB to the Control Software running on the customer’s computer.
Enabled by a special scanner design and a real time position measurement system the instrument offers a linear time scale and different factory calibrated scan ranges. In combination with a high resolution digitization and fast processing, the pulseLink provides the measured autocorrelation function and pulse width data at a high refresh rate and with a very high precision.
Furthermore the center wavelength of the input laser beam is derived from the interferometric autocorrelation data. Using an external trigger the measuring process is also optimized for the measurement of low repetition rate lasers.
The included Control Software allows for easy data export for further analysis.
Please see pulseCheck USB MIR for a wavelength range from 2 ... 12 µm.
1) An Optics Set consists of a mounted non-linear crystal as well as a detector. When upgrading Optic Sets, please ask A·P·E or your distributor for details.
|Scan ranges||150 fs ... 15 ps||500 fs ... 50 ps||1.5 ps ... 150 ps|
|Delay resolution||< 0.5 fs||< 1 fs||< 1 fs|
|Measurable pulse width||< 50 fs ... 3.5 ps||< 50 fs ... 12 ps||< 50 fs ... 35 ps|
|Input polarization||linear / horizontal (polarization rotator optionally for vertical input)|
|Diameter input aperture||6 mm (open) or 3 mm (in adjustment position)|
|Sensitivity1) for VIS 1, VIS 2, NIR and IR|
|(others optional between 200 nm and 2.4 µm),
pulseCheck USB MIR for wavelength ranges between 2 ... 12 µm
|1) Sensitivity is defined as average power times peak power of the incident pulses PAV * PPeak.
When configurating the pulseCheck USB with multiple optics sets, custom optics sets, or on the pulseCheck USB MIR sensitivity may be lower than specified above.
2) With photodiode (PD) only
This device is available directly via A·P·E and in the countries listed below via our exclusive distribution partners:
Australia: Coherent Scientific
Great Britain and Ireland: Photonic Solutions
India: Laser Science
Israel: Ammo Engineering
Scandinavia, Baltic States: Gammadata
Spain, Portugal: Innova Scientific
USA, Canada, Middle and South America: A.P.E America
A selection of publications mentioning the use of the pulseCheck:
Chapman et al., Femtosecond pulses at 20 GHz repetition rate through spectral masking of a phase modulated signal and nonlinear pulse compression,
Optics Express, Vol. 21, Issue 5, pp. 5671-5676 (2013), Link (DOI) | Link
Mou et al., Passively harmonic mode locked erbium doped fiber soliton laser with carbon nanotubes based saturable absorber,
Optical Materials Express, Vol. 2, Issue 6, pp. 884-890 (2012), Link (DOI) | Link
Nillon et al., Versatile dual stage tunable NOPA with pulse duration down to 17 fs and energy up to 3 μJ at 500 kHz repetition rate,
The European Conference on Lasers and Electro-Optics (2013), Link (DOI) | Link
Liu et al., High-power wavelength-tunable photonic-crystal-fiberbased oscillator-amplifier-frequency-shifter femtosecond laser system and its applications for material microprocessing,
Laser Physics Letters, Vol. 6, Issue 1, pp. 44-48 (2009), Link (DOI) | Link
Nomura et al., Observation and analysis of structural changes in fused silica by continuous irradiation with femtosecond laser light having an energy density below the laser-induced damage threshold,
Beilstein Journal of Nanotechnology, Vol. 5, pp. 1334-40 (2014), Link (DOI) | Link