Compact LX Spider

Pulse Diagnostics

APE offers a choice of solutions for ultrafast pulse measurements. Each is tailored to your type of laser system, with a wealth of innovations for greater accuracy and user simplicity.


Our Spider family is designed for phase resolved ultrafast pulse measurements. FC (Few Cycle) Spider offers a precision tool for the complete characterization of ultrashort laser pulses with just a few electric field cycles — down to 5 fs pulse width. LX Spider is a highly compact instrument for the characterization of femtosecond laser pulses in the range of 16 ... 200 fs.


The Compact Choice for the Ti:Sa Wavelength Range

The Compact LX Spider by APE is a portable, compact and robust instrument for spectral and temporal characterization of femtosecond laser pulses. It is the ideal candidate for Ti:Sa laser applications and other ultrashort pulse oscillators or amplifiers in the wavelength range 750 – 900 nm.

Two interchangeable Optics Sets are available to cover pulse durations between 16 and 300 fs.

Based on the popular Spider method (Spectral Phase Interferometry for Direct Electric-field Reconstruction), the Compact LX Spider allows you to visualize the spectral and temporal characteristics of the measured pulse.

The patented optical design* incorporates a long crystal to up-convert two test pulse replicas. It also introduces spectral shear without the need for an additional chirped pulse. Both the temporal amplitude and the phase are calculated in real-time.

The Compact LX Spider has been drastically simplified to feature fewer optical components, making it much easier to align and use. It is delivered as a pre-calibrated unit, complete with hardware and software. One click of the mouse and recalibration of this fully automated device is performed within seconds.

Watch our Compact LX Spider video.

* International Patent No.: US 7,599,067 B2, WO 2006123148


  • Ideal for the wavelength range of 750 – 900 nm, e.g. Ti:Sa Laser
  • Compact and robust design for easy portability
  • Real-time measurement of phase/intensity profiles
  • Software suite included
  • Fully automated


  • Spectral and temporal reconstruction
  • Bar plot of dispersion orders
  • Spectral phase fit and analysis up to fourth order


Wavelength Range
750 - 900 nm
Typical Applications Ti:Sa Laser characterization
Optics Sets Exchangeable
Spectral Bandwidth Depending on Optics Set
Optics Set 1: 13 … 65 nm
Optics Set 2: 5 … 15 nm
Pulse Width Depending on Optics Set
Optics Set 1: 16 … < 150 fs
Optics Set 2: 70 … < 300 fs
Laser Repetition Rate Any; Single Shot
Input Polarization Linear (any orientation)
Input Power > 10 mW at e.g. 80 MHz, 80 fs
20 mW at e.g. 5 kHz, 35 fs
Input Trigger TTL for f < 10 Hz  
Connection USB
Software Included; Features e.g.
▪ Spectral and temporal reconstruction
▪ Bar plot of dispersion orders suitable for alignment purpose
▪ Spectral phase fit and analysis up to fourth order



This device is available directly via A·P·E and in the countries listed below via our exclusive distribution partners:

Australia: Coherent Scientific

China: Pinnacle / PulsePower

France: Optoprim

Great Britain and Ireland: Photonic Solutions

India: Laser Science

Israel: Ammo Engineering

Japan: Phototechnica

Korea: RayVis

Poland: Eurotek

Scandinavia, Baltic States: Gammadata

Singapore: AceXon

Spain, Portugal: Innova Scientific

Switzerland: Dyneos

Taiwan: SuperbIN

USA, Canada, Middle and South America: A.P.E America

  • Optics Set 1 or Optics Set 2        
  • Notebook with pre-installed Software

A selection of publications mentioning the use of the LX Spider:

Radunsky et al., Compact spectral shearing interferometer for ultrashort pulse characterization,
Optics Letters, Vol. 32, No. 2, pp. 181 - 183 (2007), Link (DOI) | Link

Radunksy, Simplified spectral phase interferometry for direct electric-field reconstruction by using a thick nonlinear crystal,
Optics Letters, Vol. 31, No. 7, pp. 1008-1010 (2006), Link (DOI) | Link

Gorza et ca., Spectral shearing interferometry with spatially chirp beams,
Optics Express, Vol. 15, No. 23, pp. 15168 - 15174 (2007), Link (DOI) | Link